Precision of Silicon Oxynitride Refractive-Index Profile Retrieval Using Optical Characterization — ERRATUM
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Abstract
Erratum to the paper Doi: 10.12693/APhysPolA.140.215
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How to Cite
[1]
V. Kanclíř, J. Václavík, and K. Žídek, “Precision of Silicon Oxynitride Refractive-Index Profile Retrieval Using Optical Characterization — ERRATUM”, Acta Phys. Pol. A, vol. 147, no. 6, p. 498, Jul. 2025, doi: 10.12693/APhysPolA.147.498.
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