Reassessing Plasma Resonance in THz Detection: Energy Losses of Carriers in Field-Effect Transistors
Main Article Content
Abstract
The conditions required for the generation of surface plasmons at the dielectric–semiconductor interface are crucial for evaluating the suitability of the plasmon model for the description of THz detection using field-effect transistors. Existing literature often simplifies the plasma resonance formula, neglecting energy losses of free carriers, which is especially problematic near the threshold voltage regime of transistors. In this paper, we show that an insufficient number of free carriers in this regime prevents the plasmon formation in wideband semiconductors at room temperature, which challenges the validity of the plasmon model under these conditions.
Article Details

This work is licensed under a Creative Commons Attribution 4.0 International License.
References
M. Dyakonov, M. Shur, IEEE Trans. Electron Devices 43, 380 (1996), https://doi.org/10.1109/16.485650
M. Zaborowski, J. Marczewski, D. Tomaszewski, P. Zagrajek, in: 2023 48th Int. Conf. on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), Montreal, IEEE, 2023, https://doi.org/10.1109/IRMMW-THz57677.2023.10299265
S.J. Allen Jr., D.C. Tsui, R.A. Logan, Phys. Rev. Lett. 38, 980 (1977), https://doi.org/10.1103/PhysRevLett.38.980
M. Dresselhaus, G. Dresselhaus, S. Cronin, A.G. Souza Filho, Solid State Properties From Bulk to Nano, Springer, Berlin 2018, https://doi.org/10.1007/978-3-662-55922-2
M. Fox, Optical Properties of Solids, 2nd ed, Oxford Press, Oxford 2010
M. van Exter, G. Grischkowsky, Phys. Rev. B 41, 12140 (1990), https://doi.org/10.1103/PhysRevB.41.12140
K.J. Willis, S.C. Hagness, I. Knezevic, Appl. Phys. Lett. 102, 122113-1 (2013), https://doi.org/10.1063/1.4798658
J. Marczewski, M. Zaborowski, D. Tomaszewski, P. Zagrajek, N. Palka, Opto-Electron. Rev. 32, e151989 (2024), https://doi.org/10.24425/opelre.2024.151989
J. Marczewski, D. Tomaszewski, M. Zaborowski, P. Bajurko, IEEE Trans. Terahertz Sci. Technol. 12, 633 (2022), https://doi.org/10.1109/TTHZ.2022.3191836
E.H. Hwang, E. Rossi, S. Das Sarma, Phys. Rev. B 80, 235415 (2009), https://doi.org/10.1103/PhysRevB.80.235415
H.G. Roskos, M. Bauer, K. Ikamas, F. Ludwig, A. Lisauskas, in: 2018 43rd Int. Conf. on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Nagoya, 2018, http://doi.org/10.1109/IRMMW-THz.2018.8510444
E.L. Ivchenko, Phys. Solid State 56, 2514 (2014), https://doi.org/10.1134/S1063783414120142