Phase Formation and Structural Analysis via X-Ray Diffraction: Insights into Material Stability and Properties

Abstract

This review investigates thin films of CoCr-based high-entropy alloys, focusing on their contributions to physics through the study of phase formation and their analysis using X-ray diffraction. By leveraging the principles of crystallography and solid-state physics, the project addresses critical challenges in understanding phase transitions and microstructural evolution in CoCr-based high-entropy alloy system. X-ray diffraction provides key insights on lattice parameters, crystallite size, and strain, linking these parameters to material properties and stability. The integration of computational modeling and experimental techniques emphasizes the project's role in advancing knowledge of phase behavior and its applications in automotive, hard coatings, and even semiconductor. This concise assessment highlights the importance of X-ray diffraction-driven studies in shaping future directions in materials science and physics research.