Computation-Efficient Precise Determination of Tilt Using Acceleration Measurements

Article Sidebar

PDF
Published: Nov 15, 2024
DOI: https://doi.org/10.12693/APhysPolA.146.630
Keywords:
microelectromechanical system (MEMS), accelerometer, tilt, alignment

Main Article Content

M. Zams
Faculty of Mechatronics, Institute of Micromechanics and Photonics, Warsaw University of Technology, św. A. Boboli 8, 02-525 Warsaw, Poland
S. Łuczak
Faculty of Mechatronics, Institute of Micromechanics and Photonics, Warsaw University of Technology, św. A. Boboli 8, 02-525 Warsaw, Poland

Abstract

A custom instrument designed to minimize errors of tilt detection (based on acceleration measurements) due to misalignments of the employed microelectromechanical system sensors is presented. Owing to special housing, the sensors can be easily aligned and calibrated, and the instrument can be precisely mounted in the end device that utilizes tilt detection. The procedure of a standard calibration for the sensors is briefly described, and a novel method of their alignment is discussed. Thus, a new computation-efficient solution for the precise determination of dual-axis tilt using low-cost accelerometers is introduced. A related application of the instrument (monitoring of axial run-out) is mentioned.

Article Details

How to Cite
[1]
M. Zams and S. Łuczak, “Computation-Efficient Precise Determination of Tilt Using Acceleration Measurements”, Acta Phys. Pol. A, vol. 146, no. 4, p. 630, Nov. 2024, doi: 10.12693/APhysPolA.146.630.
Issue
Vol. 146 No. 4 (2024): Proceedings of the 21st International Conference on Global Research and Education (Inter-Academia 2024)
Section
Special segment
Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.

References

Z. Syed, P. Aggarwal, C. Goodall, X. Niu, N. El-Sheimy, Meas. Sci. Technol. 18, 1897 (2007)

A. Olivares, G. Ruiz-Garcia, G. Olivares, J.M. Górriz, J. Ramirez, Sensors 13, 11797 (2013)

S.P. Won, F. Golnaraghi, IEEE Trans. Instrum. Meas. 59, 2144 (2010)

W.T. Ang, P.K. Khosla, C.N. Riviere, IEEE Sens. J. 7, 81 (2007)

W. Yang, B. Fang, Y.Y. Tang, J. Qian, X. Qin, W. Yao, IEEE Sensors J. 13, 2313 (2013)

I. Frosio, F. Pedersini, N.A. Borghese, IEEE Sens. J. 12, 2100 (2012)

J. Qian, B. Fang, W. Yang, X. Luan, H. Nan, IEEE Sens. J. 11, 2301 (2011)

M. Šipoš, P. Pačes, J. Rohac; P. Novacek, IEEE Sens. J. 12, 1157 (2012)

M. Zams, S. Łuczak, in: Inter-Academia 2023. Lecture Notes in Networks and Systems, Vol. 939, Eds. Y. Ono, J. Kondoh, 2024 p. 202

S. Łuczak, M. Zams, Polish Patent Office, patent pending: P.449531, 2024 (in Polish)

M. Zams, P. Pieńczuk, S. Łuczak, Acta Phys. Pol. A 146, 419 (2024)

S. Stančin, S. Tomažič, Sensors 14, 14885 (2014)

S. Łuczak, Mechatronics. Recent Technological and Scientific Advances, Springer-Verlag, Berlin Heidelberg 2012, p. 705

S. Łuczak, Recent Advances in Mechatronics, Springer-Verlag, Berlin Heidelberg 2007, p. 511

S. Lian, W. Meng, K. Shao, J. Zheng, S. Zhu, H. Li, IEEE Trans. Ind. Electron. 70, 3975 (2023)

D. Farago, B. Maczak, Z. Gingl, IEEE Access 12, 38102 (2024)

S. Łuczak, in: Recent Global Research and Education: Technological Challenges, Eds. R. Jabłoński, R. Szewczyk, Springer International Publishing, Switzerland 2017, p. 287

S. Łuczak, M. Zams, Adv. Intell. Syst. Comput. 1044, 274 (2020)

Z. Kusznierewicz, M. Michałowski, S. Łuczak, K. Bagiński, B. Kabziński, M. Zams, IEEE Access 8, 78622 (2020)

S. Nadig, A. Lal, in: 2018 IEEE Int. Reliability Physics Symp. (IRPS), Burlingame (CA), 2018, p. 3C.8-1

S. Łuczak, M. Zams, B. Bąbrowski, Z. Kusznierewicz, Sensors 22, 1504, (2022)