Effects of Sodium Sulphide as an Inhibitor on CdS Films Obtained by Chemical Bath Deposition

Abstract

In the present study, CdS thin films were produced on glass substrates by the chemical bath deposition method, and sodium sulfite was used to reduce the reaction rate. Based on the absorbance measurements, it was found that the energy band gaps of the films increased from 2.35 to 2.49 eV depending on the amount of inhibitor. It was also found that when the reaction rate decreased, the crystal structure of the films shifted from the cubic phase to the hexagonal phase in reference to the X-ray diffraction results. When CdS thin films had the hexagonal phase, it was seen in the scanning electron microscope images that pinholes and voids were not seen on the surface of the films. Surface roughness values were calculated using scanning electron microscope images, and these values were found to vary between 22 nm and 9 nm.